ORIGINAL RESEARCH
Assessing Heavy Metal Pollution in Surface Sediments of China’s Shaying River
 
 
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Geographical Science School of Nanjing Normal University, Nanjing, China Center of Environment Science Experiment, Bengbu University, Bengbu, China
 
 
Submission date: 2018-06-24
 
 
Final revision date: 2018-09-01
 
 
Acceptance date: 2018-09-08
 
 
Online publication date: 2019-07-30
 
 
Publication date: 2019-09-17
 
 
Corresponding author
Kaisheng Zhou   

Bengbu University, No. 1866, Caoshan Road, Bengbu, 233030, China, 233030 Bengbu city, China, China
 
 
Pol. J. Environ. Stud. 2019;28(6):4495-4502
 
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ABSTRACT
To comprehend the contamination levels of heavy metals in surface sediments of Shaying River (Anhui Section, China), samples of sediments were collected using grab samplers in 14 sampling sites in the river. Chromium (Cr), cadmium (Cd), copper (Cu), and lead (Pb) in sediments were monitored via flame atomic absorption spectroscopy, and arsenic (As) via atomic fluorescence spectroscopy. The geo-accumulation index (Igeo), pollution load index (PLI), and potential ecological risk index (RI) were applied to evaluate the sediment pollution of the five heavy metals. The results indicate that the mean concentration levels (range) of Cr, Cd, Cu, Pb, and As in sediments were 58.38 (29.89-116.66), 5.41 (3.14-10.93), 38.51 (23.77-60.83), 35.10 (19.28-82.21), and 0.44 (0.13-1.46) mg/kg, respectively. The mean Igeo values of Cr, Cd, Cu, Pb, and As were -0.69, 5.41, 0.36, -0.13, and -4.84, respectively. The average potential ecological coefficients (Eri) of Cr, Cd, Cu, Pb, and As were 1.95, 324.70, 6.42, 7.02, and 0.29, respectively. The RI values of the five heavy metals ranged from 197.65 to 687.24, and the mean was 340.38. Among the studied heavy metals, Cd was the highest contaminating element, whereas As was the lowest. Especially Cd was the main contributor to RI in all the sampling sites. Moreover, Cr, Cd, Pb, and As might have similar sources of contamination based on the Pearson correlation matrix of analysis.
eISSN:2083-5906
ISSN:1230-1485
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