X-ray fluorescence spectrometry in speciation analysis of bottom sediments
Baranowski R, Rybak A, Sobczynski T
 
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Baranowski R, Silesian Tech Univ, Dept Analyt Chem, Strzody 9, PL-44100 Gliwice, Poland
Silesian Tech Univ, Dept Analyt Chem, PL-44100 Gliwice, Poland
Adam Mickiewicz Univ Poznan, Dept Water & Soil Anal, PL-61712 Poznan, Poland
 
Pol. J. Environ. Stud. 2001;10(5):297–306
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ABSTRACT
This paper presents results of speciation analysis of bottom sediments. In our examinations a five-step extraction procedure was applied. Direct analysis of sediments and analysis of extracts was carried out by X-ray fluorescence spectrometry with wavelength dispersion. Examinations were carried out with the use of lake sediments CRM.
eISSN:2083-5906
ISSN:1230-1485