ORIGINAL RESEARCH
Exploring Multivariate Relationships Among Seed Morphometric and Yield-Related Traits in Bread Wheat (Triticum aestivum L.)
 
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1
Institute of Molecular Biology and Biotechnology, The University of Lahore, Lahore
 
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Department of Botany, The Islamia University of Bahawalpur, Bahawalpur, 63100, Pakistan
 
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Department of Botany, University of Sargodha, Sargodha
 
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Institute of Molecular Biology and Biotechnology, University of Lahore Sargodha Campus
 
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Department of Agronomy, Faculty of Agriculture and Environment, The Islamia University of Bahawalpur, Bahawalpur, 63100, Pakistan
 
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College of Agronomy, Northwest A & F University, Yangling, 712100 Shaanxi, China
 
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Department of Food Science and Nutrition, College of Agriculture Food Science, King Saud University, Riyadh, Saudi Arabia
 
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Department of Botany and Microbiology, College of Science, King Saud University, Riyadh 11451, Saudi Arabia
 
 
Submission date: 2023-12-24
 
 
Final revision date: 2024-03-11
 
 
Acceptance date: 2024-04-20
 
 
Online publication date: 2024-09-03
 
 
Publication date: 2025-01-28
 
 
Corresponding author
Muhammad Jamil   

Department of Botany, The Islamia University of Bahawalpur, Bahawalpur, 63100, Pakistan
 
 
Usman Zulfiqar   

Department of Agronomy, Faculty of Agriculture and Environment, The Islamia University of Bahawalpur, Bahawalpur, 63100, Pakistan
 
 
Pol. J. Environ. Stud. 2025;34(3):2003-2010
 
KEYWORDS
TOPICS
ABSTRACT
Correlation and path analysis for seed morphometric as well as yield-related traits were performed on five bread wheat varieties, each sown on an area of one acre; this investigation was carried out to check the influence of these traits on the grain yield of bread wheat (Triticum aestivum L.). Digital image analysis (DIA) is a quantitative technique to phenotype seed morphometric characteristics with high accuracy. Multivariate analysis was performed to determine the relationship bdeetween ground cover (GC) and seed size and grain yield (GY). Significantly important traits were identified by principal component analysis (PCA). Applying the multiple linear regression model, grain yield was predicted with the help of ground cover and seed shape traits. The association of the studied traits was quantified with a structural equation model. The impact of spikes per meter square (SPMS) and thousand kernel weights (TKW) on grain yield was significant (p-value <.01). Plant height has a detrimental impact on grain yield, and the grain yield was influenced by two features: spikes per meter square (SPMS) and grain weight per spike (GWS), which have a direct impact on thousand kernel weight (TKW). The present research aims to feature the relationship between yield-contributing characteristics and the digital ground cover of the wheat crop. The present work uncovered the fact that digital ground cover (DGC) influences the seed length, area, and perimeter.
CONFLICT OF INTEREST
The authors declare that they have no known competing financial interests or personal relationships that could have appeared to influence the work reported in this paper.
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